Citation

Kececioglu D, Jacks JA. Reliab. Eng. 1984; 8(1): 1-9.

Copyright

(Copyright © 1984, Elsevier Publishing)

DOI

10.1016/0143-8174(84)90032-5

PMID

unavailable

Abstract

The Arrhenius, Eyring, inverse power law and combination models for accelerated life testing and reliability determination are presented. All methods test the components at higher stress levels (i.e. temperature, voltage, vibration) than would be experienced during normal operation. The data collected from such an accelerated life test (ALT) are then used to determine the reliability at a given stress level and component life.

The Arrhenius and the Eyring models are applicable when temperature is the accelerated stress variable. The inverse power law usually considers high voltage as the accelerated variable. It has also been used for bearing lives. The combination model considers the effect of both elevated temperature and high voltage on the characteristic life.