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Citation |
Baeri P, Grimaldi MG, La Via F, Spinella C, Spoto G. International Journal of Thermophysics 1993; 14(3): 383-396. |
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Copyright |
(Copyright © 1993) |
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DOI |
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PMID |
unavailable |
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Abstract |
Ti, Fe, and Co silicide layers, 80-200 nm thick, on top of single crystal silicon substrate have been melted by 25-ns ruby laser pulses and the resolidified structures have been analyzed by transmission electron microscopy, X-ray diffraction, and Rurtherford backscattering spectrometry. Metastable phases and/or epitaxial layers are obtained upon solidifcation. The transient molten layer has been monitored by means of time-resolved optical measurements with nanosecond resolution; in all cases solidification velocity of the order of 1 m · s-1 was observed, and in one case liquid undercooling as much as 800 K was estimated. © 1993 Plenum Publishing Corporation. Language: en |
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Keywords |
suicide; phase transition; laser pulse; melting; solidification |