Citation

Liu Y, Zhou X, Yu Y. Analyst 2015; 140(23): 7984-7996.

Affiliation

State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing, 100083, China. yjliu@semi.ac.cn.

Copyright

(Copyright © 2015, Royal Society of Chemistry)

DOI

10.1039/c5an01184a

PMID

26517702

Abstract

A novel approach, coined the Corner-Cutting method (CC, for short), is presented in this paper which affords the efficient construction of the baseline for analytical data streams. It was derived from techniques used in computer aided geometric design, a field established to produce curves and surfaces for the aviation and automobile industries. This corner-cutting technique provided a very efficient baseline calculation through an iterative process. Furthermore, a terminal condition was developed to make the process fully automated and truly non-parametric. Finally, we employed a Bezier curve to convert the iterating result into a smooth baseline solution. Compared to other iterative schemes used for baseline detection, our method was significantly efficient, easier to implement, and had a broader range of applications.

Language: en