Citation

Hale PW. Reliab. Eng. 1986; 14(4): 247-255.

Copyright

(Copyright © 1986, Elsevier Publishing)

DOI

10.1016/0143-8174(86)90060-0

PMID

unavailable

Abstract

Two empirical equations giving the test strength of constant temperature and thermal cycling environments are compared for effectiveness in precipitating defects in electronic components. Analysis of the equations shows that they can be put into a form which has a theoretical basis although the structure still remains empirical.