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Citation |
Erath SA, El‐Sheikh M, Mark Cummings E. Child Dev. 2009; 80(2): 578-592. |
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Copyright |
(Copyright © 2009, John Wiley and Sons) |
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DOI |
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PMID |
unavailable |
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Abstract |
Skin conductance level reactivity (SCLR) was examined as a moderator of the association between harsh parenting and child externalizing behavior. Participants were 251 boys and girls (8–9 years). Mothers and fathers provided reports of harsh parenting and their children’s externalizing behavior; children also provided reports of harsh parenting. SCLR was assessed in response to a socioemotional stress task and a problem‐solving challenge task. Regression analyses revealed that the association between harsh parenting and externalizing behavior was stronger among children with lower SCLR, as compared to children with higher SCLR. SCLR may be a more robust moderator among boys compared to girls. Results are discussed with regard to theories on antisocial behavior and multiple‐domain models of child development. |