TY - JOUR PY - 2018// TI - Psychotic-like experiences in pre-adolescence: what precedes the antecedent symptoms of severe mental illness? JO - Acta psychiatrica Scandinavica A1 - Bolhuis, K. A1 - Koopman-Verhoeff, M. E. A1 - Blanken, L. M. E. A1 - Cibrev, D. A1 - Jaddoe, V. W. V. A1 - Verhulst, F. C. A1 - Hillegers, M. H. J. A1 - Kushner, S. A. A1 - Tiemeier, H. SP - 15 EP - 25 VL - 138 IS - 1 N2 - OBJECTIVE: Adolescent psychotic-like experiences predict the onset of psychosis, but also predict subsequent non-psychotic disorders. Therefore, it is crucial to better understand the aetiology of psychotic-like experiences. This study examined whether (a) child emotional and behavioural problems at 3 and 6 years, or (b) childhood adversities were associated with psychotic-like experiences at age 10 years.

METHOD: This prospective study was embedded in the Generation R Study; 3984 children (mean age 10 years) completed a psychotic-like experiences questionnaire. Mothers reported problems of their child at ages 3, 6 and 10 years. Additionally, mothers were interviewed about their child's adversities.

RESULTS: Psychotic-like experiences were endorsed by ~20% of children and predicted by both emotional and behavioural problems at 3 years (e.g. emotional-reactive problems: ORadjusted = 1.10, 95% CI: 1.06-1.15, aggressive behaviour: ORadjusted = 1.03, 95% CI: 1.02-1.05) and 6 years (e.g. anxious/depressed problems: ORadjusted = 1.11, 95% CI: 1.06-1.15, aggressive behaviour: ORadjusted = 1.04, 95% CI: 1.04-1.05). Childhood adversities were associated with psychotic-like experiences (>2 adversities: ORadjusted = 2.24, 95% CI: 1.72-2.92), which remained significant after adjustment for comorbid psychiatric problems.

CONCLUSION: This study demonstrated associations between early adversities, childhood emotional and behavioural problems and pre-adolescent psychotic-like experiences, which will improve the understanding of children at increased risk of severe mental illness.

© 2018 John Wiley & Sons A/S. Published by John Wiley & Sons Ltd.

Language: en

LA - en SN - 0001-690X UR - http://dx.doi.org/10.1111/acps.12891 ID - ref1 ER -