TY  - JOUR
PY  - 1999//
TI  - Applications of focused ion beam systems in gunshot residue investigation
JO  - Journal of forensic sciences
A1  - Niewöhner, L.
A1  - Wenz, H. W.
SP  - 105
EP  - 109
VL  - 44
IS  - 1
N2  - Scanning ion microscopy technology has opened a new door to forensic scientists, allowing the GSR investigator to see inside a particle's core. Using a focused ion beam, particles can be cross-sectioned, revealing interior morphology and character that can be utilized for identification of the ammunition manufacturer.<p /> <p>Language: en</p>
LA  - en
SN  - 0022-1198
UR  - http://dx.doi.org/
ID  - ref1
ER  -