%0 Journal Article
%T The detection of structural conversions in crystallizing thin films of the Ta-Si system by the method of coherent optical Fourier-analysis
%J Defect and Diffusion Forum
%D 2001
%A Sidorenko, S.I.
%A Makogon, Yu.N.
%A Mokhort, V.A.
%A Dziaryk, A.A.
%A Zelenin, O.V.
%V 
%N 194-199 PART 2
%P 1637-1642
%X <p>[Abstract unavailable]</p><p>Language: en</p>
%G en
%I 
%@ 1012-0386
%U http://dx.doi.org/10.4028/www.scientific.net/ddf.194-199.1637