@article{ref1,
title="Applications of focused ion beam systems in gunshot residue investigation",
journal="Journal of forensic sciences",
year="1999",
author="Niewöhner, L. and Wenz, H. W.",
volume="44",
number="1",
pages="105-109",
abstract="Scanning ion microscopy technology has opened a new door to forensic scientists, allowing the GSR investigator to see inside a particle's core. Using a focused ion beam, particles can be cross-sectioned, revealing interior morphology and character that can be utilized for identification of the ammunition manufacturer.<p /><p>Language: en</p>",
language="en",
issn="0022-1198",
doi="",
url="http://dx.doi.org/"
}